Auger and SIMS study of segregation and corrosion behaviour of some semiconducting oxide gas-sensor materials
- 30 April 1994
- journal article
- Published by Elsevier in Sensors and Actuators B: Chemical
- Vol. 19 (1-3) , 569-572
- https://doi.org/10.1016/0925-4005(93)01088-l
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Comment on “Interfacial Segregation in Perovskites: I‐IV”Journal of the American Ceramic Society, 1992
- Characterization and crystallite growth of semiconducting high-temperature-stable Ga2O3 thin filmsJournal of Materials Science Letters, 1992
- Interfacial Segregation in Perovskites: I, TheoryJournal of the American Ceramic Society, 1990
- Electrical conductivity of sputtered films of strontium titanateJournal of Applied Physics, 1990
- dc Electrical Degradation of Perovskite‐Type Titanates: I, CeramicsJournal of the American Ceramic Society, 1990