High‐ vs. Low‐Stress Yield Test Environments for Selecting Superior Soybean Lines
- 1 July 1990
- journal article
- research article
- Published by Wiley in Crop Science
- Vol. 30 (4) , 912-918
- https://doi.org/10.2135/cropsci1990.0011183x003000040031x
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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- SOIL DENSITY AND ROOT PENETRATIONSoil Science, 1948