Chemical Effects in CarbonX-Ray Yields
- 28 January 1980
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 44 (4) , 241-244
- https://doi.org/10.1103/physrevlett.44.241
Abstract
Proton-induced carbon x-ray yields, measured for a wide variety of C-bearing gases at 2 MeV, vary more than 25%. A simple statistical model, based on estimates of the number of valence electrons with character available to fill a vacancy, gives good quantitative agreement with experimental results.
Keywords
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