Crystallization of Amorphous Marks in SbTe Erasable Optical Storage Media
- 1 January 1987
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 26 (S4)
- https://doi.org/10.7567/jjaps.26s4.51
Abstract
We present new measuring methods for amorphizing sensitivity, erasing time and amorphous life at room temperature of small amorphous marks formed by laser quenching. It is found that the Sb2Te3 film has both the shortest erasing time and the longest life of the SbxTe1-x sputtered films. In addition, the amorphous state of marks crystallizes at a lower temperature than that of as-sputtered films.Keywords
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