Imaging Magnetic Bit Patterns Using a Scanning Tunneling Microscope with a Flexible Tip
- 1 January 1991
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- High-resolution, tunneling-stabilized magnetic imaging and recordingApplied Physics Letters, 1990
- Separation of magnetic and topographic effects in force microscopyJournal of Applied Physics, 1990
- Measurement of in-plane magnetization by force microscopyApplied Physics Letters, 1988
- Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolutionApplied Physics Letters, 1987
- Tunneling experiments involving magnetic tip and magnetic sampleZeitschrift für Physik B Condensed Matter, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986