Thermal expansion behavior of silicon at low temperatures
- 1 January 1972
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 10 (1) , 159-162
- https://doi.org/10.1016/0038-1098(72)90371-7
Abstract
No abstract availableKeywords
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- Measurement of Elastic Constants at Low Temperatures by Means of Ultrasonic Waves–Data for Silicon and Germanium Single Crystals, and for Fused SilicaJournal of Applied Physics, 1953