Near-threshold electron impact ionisation of helium
- 14 August 1982
- journal article
- Published by IOP Publishing in Journal of Physics B: Atomic and Molecular Physics
- Vol. 15 (15) , 2509-2515
- https://doi.org/10.1088/0022-3700/15/15/023
Abstract
Uses an electron trap spectrometer in a fixed incident energy mode of operation to explore near-threshold ionisation of helium. The authors find that the partitioning of the excess energy between the two outgoing electrons is random for incident energies up to 30 eV. The energy dependence of the associated total ionisation cross sections is consistent with that of other experimental measurements.Keywords
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