Grain Boundary Dopant and Heat Treatment Effects on the Electrical Properties of Polycrystalline ZnO
- 1 January 1995
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Characterization of the Interface States in ZnO Varistors by DLTS MethodJournal of the Ceramic Society of Japan, 1989
- Carrier transport through grain boundaries in semiconductorsPhysical Review B, 1986