Spectroscopic Ellipsometry Investigation of the Swelling of Poly(Dimethylsiloxane) Thin Films with High Pressure Carbon Dioxide
- 4 January 2001
- journal article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry B
- Vol. 105 (4) , 766-772
- https://doi.org/10.1021/jp002592d
Abstract
No abstract availableKeywords
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