Probability of Double Ionization by Electron Impact for Neon, Argon, and Xenon

1 November 1959

journal article
conference paper
Published by AIP Publishing in The Journal of Chemical Physics

Vol. 31 (5) , 1320-1323
https://doi.org/10.1063/1.1730592

Abstract

The ionization efficiency curves for the double ionization by electron impact of Ne, Ar, and Xe have been re-examined. It is shown that, near the threshold, the probability of double ionization varies as the square of the excess electron energy. Upper states of the ions are detected and the determination of appearance potentials for such processes is discussed.

Keywords

ELECTRON IMPACT

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