Reflection high-energy electron diffraction studies of the growth of InAs/Ga1−xInxSb strained-layer superlattices
- 1 July 1992
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 10 (4) , 1779-1783
- https://doi.org/10.1116/1.586240