Inelastic background correction and quantitative surface analysis
- 31 December 1990
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 52, 243-271
- https://doi.org/10.1016/0368-2048(90)85022-2
Abstract
No abstract availableThis publication has 28 references indexed in Scilit:
- Quantitation of coverages on rough surfaces by XPS: An overviewSurface and Interface Analysis, 1988
- Test of algorithm for background correction in XPS under variation of XPS peak energySurface and Interface Analysis, 1988
- Calculations of electron inelastic mean free paths for 31 materialsSurface and Interface Analysis, 1988
- Quantitative analysis of the inelastic background in surface electron spectroscopySurface and Interface Analysis, 1988
- Differential inelastic electron scattering cross sections from experimental reflection electron-energy-loss spectra: Application to background removal in electron spectroscopyPhysical Review B, 1987
- Background removal in x-ray photoelectron spectroscopy: Relative importance of intrinsic and extrinsic processesPhysical Review B, 1986
- Influence of elastic and inelastic scattering on energy spectra of electrons emitted from solidsPhysical Review B, 1982
- The quantitative analysis of surfaces by XPS: A reviewSurface and Interface Analysis, 1980
- Quantitative depth profiling in surface analysis: A reviewSurface and Interface Analysis, 1980
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979