Abstract
In this paper a new dielectric measurements method in the range 200 MHz-18 GHz is reported. The main features of the system are the following: a) automatic determination of the sample complex permittivities for each step of frequency previously chosen by using a numerical process; b) cells requiring only a very small sample volume (typically lower than .1 cm/sup 3/); and c) cell structure allowing the dielectric characterization of anisotropic substances.

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