17 ps rise-time measurement by photoemission sampling

26 February 1987

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 23 (5) , 249-250
https://doi.org/10.1049/el:19870176

Abstract

We report on the first voltage measurements of signals with rise times below 20 ps by photoemission stampling based on the single-photon process. The high time and voltage resolution together with the potential of a submicrometre spatial resolution enables tesing of very high-speed VLSI circuits by this newly developed method.

Keywords

VLSI
17 PS
PHOTOEMISSION SAMPLING
VHSIC
VOLTAGE MEASUREMENTS
VOLTAGE RESOLUTION
SINGLE-PHOTON PROCESS
IC TESTING
RISE-TIME MEASUREMENT
SIGNALS WITH RISE TIMES BELOW 20 PS
SUBMICRON RESOLUTION
TIME RESOLUTION
SUBMICROMETRE SPATIAL RESOLUTION

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