A COMPUTER CONTROLLED SCANNING PROBE-HOLE FIELD EMISSION MICROSCOPE

1 November 1988

journal article
Published by EDP Sciences in Le Journal de Physique Colloques

Vol. 49 (C6) , C6-43
https://doi.org/10.1051/jphyscol:1988608

Abstract

A microprocessor controlled Field Emission Microscope is presented. It is capable of measuring changes in work function on different single crystal surfaces present on a field emission tip. During experiments the tip temperature can be measured with an accuracy of 1K. The field emission set up was tested with a series of experiments in which hydrogen was desorbed from a few selected rhodium surfaces

Keywords

SCANNING PROBE
HOLE FIELD
PROBE HOLE
EMISSION MICROSCOPE
CONTROLLED SCANNING
COMPUTER CONTROLLED
FIELD EMISSION

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