Measurement of uniformity of driving voltage in Ti:LiNbO/sub 3/ waveguides using Mach-Zehnder interferometers

1 April 1990

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Photonics Technology Letters

Vol. 2 (4) , 260-261
https://doi.org/10.1109/68.53255

Abstract

A method for measuring the spatial variation of electrically induced index change (electrooptical effect) in Ti-diffused LiNbO/sub 3/ optical waveguides is demonstrated. By segmenting the electrodes of Mach-Zehnder modulators, electrically induced index changes at as many as 45 positions on x-cut and z-cut substrates have been measured. The result confirms that the spatial variation of index change is within +or-3%.

Keywords

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