Quality test of semiconductor memories by jitter measurement

5 July 1979

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 15 (14) , 428-429
https://doi.org/10.1049/el:19790307

Abstract

This letter states the results form the application of a jitter measuring method suited to the quality testing of electronic semiconductor memories. A description is given of a jitter measuring apparatus which enables detection of latent defects in semiconductor memories.

Keywords

LATENT DEFECTS
FAULTY BONDING
MOS
LEAKAGE CURRENT PATHS
EPROM
MOISTURE EFFECT
JITTER MEASUREMENT
MEASURING APPARATUS
QUALITY TESTING
SURFACE CONTAMINATION
SEMICONDUCTOR MEMORIES

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