An efficient on-chip deterministic test pattern generation scheme
- 31 October 1989
- journal article
- Published by Elsevier in Microprocessing and Microprogramming
- Vol. 26 (3) , 195-204
- https://doi.org/10.1016/0165-6074(89)90254-8
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Group Properties of Cellular Automata and VLSI ApplicationsIEEE Transactions on Computers, 1986
- Algebraic properties of cellular automataCommunications in Mathematical Physics, 1984
- Statistical mechanics of cellular automataReviews of Modern Physics, 1983