New electron microscopy for composition analysis of GaAs/AlxGa1−xAs heterointerfaces

• 1 August 1986
• journal article
• Published by Elsevier in Surface Science
• Vol. 174  (1-3) , 84-87
• https://doi.org/10.1016/0039-6028(86)90390-0

Abstract

Keywords

• NEW ELECTRON
• ELECTRON MICROSCOPY
• XAS HETEROINTERFACES
• GAAS/ALXGA1
• COMPOSITION ANALYSIS