Abstract
Chemical variations in individual chlorite crystals of diagenetic origin delineated by energy dispersive X-ray spectroscopy (EDS) in a transmission electron microscope (TEM) indicate a temperature dependent chemical zonation in each grain. Silicon decreases and Al increases with higher temperature resulting in a decreasing Si/Al ratio away from the crystal core reflecting the time and rate of the crystal growth. Chlorite particle-size distributions obtained by scanning electron microscopy (SEM) give steady state profiles which suggests that the chlorite growth is controlled by a grain coarsening process related to Ostwald ripening.