An Insertion Loss, Phase and Delay Measuring Set for Characterizing Transistors and Two-Port Networks Between 0.25 and 4.2 gc
- 1 March 1966
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 45 (3) , 397-440
- https://doi.org/10.1002/j.1538-7305.1966.tb04215.x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Realizable Limits of Error for Dissipationless Attenuators in Mismatched SystemsIEEE Transactions on Microwave Theory and Techniques, 1964
- The Calibration of the Slotted Section for Precision Microwave MeasurementsReview of Scientific Instruments, 1954
- A Precise Sweep-Frequency Method of Vector Impedance MeasurementProceedings of the IRE, 1951