Calibration procedure for particle elastic scattering analysis of thin samples
- 1 April 1984
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 3 (1) , 268-271
- https://doi.org/10.1016/0168-583x(84)90375-6
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Background in Rutherford backscattering spectra: A simple formulaNuclear Instruments and Methods in Physics Research, 1983
- Double scattering in Rutherford backscattering spectraNuclear Instruments and Methods in Physics Research, 1982
- A facility for multielemental analysis by PIXE and the19F(p, αγ)16O reactionJournal of Radioanalytical and Nuclear Chemistry, 1982
- Light element composition of the atmospheric aerosol at Cape Grim (Tasmania) and Townsville (Queensland) by PIXE and PESANuclear Instruments and Methods, 1981
- PIXE analysis of samples of intermediate thicknessNuclear Instruments and Methods, 1981
- Multielement thin film standards for XRF analysisX-Ray Spectrometry, 1980
- Polymer Films as Calibration Standards for X-ray Fluorescence AnalysisPublished by Springer Nature ,1977
- Elemental trace analysis of small samples by proton induced x-ray emissionAnalytical Chemistry, 1975