A novel method for extracting the two-dimensional doping profile of a sub-half micron MOSFET
- 17 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- A Class of Methods for Solving Nonlinear Simultaneous EquationsMathematics of Computation, 1965