Elemental analysis of liquids by external beam PIXE down to PPB level
- 1 October 1979
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 165 (2) , 253-259
- https://doi.org/10.1016/0029-554x(79)90279-9
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Sensitivity of the external beam pixe elemental analysis methodNuclear Instruments and Methods, 1978
- An external beam technique for proton-induced X-ray emission analysisNuclear Instruments and Methods, 1976
- Analyse sous helium par la technique de fluorescence X induite par protonsNuclear Instruments and Methods, 1975
- Trace-element analysis by X-ray fluorescence with an external proton beamNuclear Instruments and Methods, 1975
- Analyse des microoquantites d'elements traces dans des substances solides par bombardement d'ionsJournal of Radioanalytical and Nuclear Chemistry, 1973