Calculation of Wavelengths from Reflecting Echelon Patterns
- 1 October 1960
- journal article
- research article
- Published by Taylor & Francis in Optica Acta: International Journal of Optics
- Vol. 7 (4) , 325-330
- https://doi.org/10.1080/713826350
Abstract
Wavelengths are calculated from measurements of reflecting echelon patterns by a simplified procedure which can be carried out conveniently, using a digital computer. By measuring to the position of the centre of the envelope, rather than to an arbitrary mirror image as hitherto, it is shown that envelope correction is automatically applied and a very simple correction for non-linearity of dispersion may be made where necessary.Keywords
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