Spectral irradiance scales based on filtered absolute silicon photodetectors
- 15 March 1987
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 26 (6) , 1051-1057
- https://doi.org/10.1364/ao.26.001051
Abstract
A scale of spectral irradiance has been realized for the 400–700-nm wavelength range based on absolute silicon photodetectors, with the wavelength selected by interference filters. From these data a photometric scale of luminous intensity has been realized. The results were compared to scales based on blackbodies.Keywords
This publication has 11 references indexed in Scilit:
- Silicon photodiode device with 100% external quantum efficiencyApplied Optics, 1983
- Complete collection of minority carriers from the inversion layer in induced junction diodesJournal of Applied Physics, 1981
- Absolute spectroradiometric and photometric scales based on an electrically calibrated pyroelectric radiometerApplied Optics, 1981
- Calibration of incandescent lamps for spectral irradiance by means of absolute radiometersApplied Optics, 1980
- Silicon photodiode absolute spectral response self-calibrationApplied Optics, 1980
- Quantum efficiency of the p-n junction in silicon as an absolute radiometric standardApplied Optics, 1979
- Thin film narrow band optical filtersThin Solid Films, 1976
- New Reference SpectrophotometerApplied Optics, 1973
- Further work on a radiometric method of perpetuating the unit of lightProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1964
- A radiometric method of perpetuating the unit of lightProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1963