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Some observations on the use of reliability indices in LEED crystallography
Home
Publications
Some observations on the use of reliability indices in LEED crystallography
Some observations on the use of reliability indices in LEED crystallography
SH
S. Hengrasmee
S. Hengrasmee
KM
K. A. R. Mitchell
K. A. R. Mitchell
PW
P. R. Watson
P. R. Watson
SW
S. J. White
S. J. White
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1 February 1980
journal article
Published by
Canadian Science Publishing
in
Canadian Journal of Physics
Vol. 58
(2)
,
200-206
https://doi.org/10.1139/p80-032
Abstract
No abstract available
Keywords
RELIABILITY
LEED CRYSTALLOGRAPHY
BAND STRUCTURE
INTENSITY VERSUS ENERGY
ERROR HAS BEEN CORRECTED
CONJUNCTION
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