Abstract
The velocity distribution of electrons in field emission has been calculated on the basis of a simple free electron or one‐band model. It is found that the component of velocity transverse to the direction of emission varies approximately as the square root of the applied field. This leads to the result that resolution in the field emission microscope is practically independent of applied voltage, since transit times vary as V−½; resolution turns out to be of the order of 30A. Image formation in the case of molecules and the resolution obtainable with the proton microscope are briefly discussed.

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