Lamellar Defects in Single Crystals of Silicon
- 1 February 1955
- journal article
- Published by IOP Publishing in Proceedings of the Physical Society. Section B
- Vol. 68 (2) , 111-112
- https://doi.org/10.1088/0370-1301/68/2/307
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Elektronisches Verhalten bestimmter Korngrenzen in perfekten KristallenZeitschrift für Naturforschung A, 1954
- An evaporated carbon replica technique for use with the electron microscope and its application to the study of photographic grainsBritish Journal of Applied Physics, 1954
- Grain Boundary Barriers in GermaniumPhysical Review B, 1952