Influence of Line Profile on Counting Loss Correction
- 1 November 1967
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 6 (11)
- https://doi.org/10.1143/jjap.6.1263
Abstract
The recent progress in precision of X-ray diffractometry has made it necessary to take account of possible errors of various origins so far neglected. It is shown that the influence of line profile of a reflection on counting loss correction is not always negligible. Approximate estimations were made on this influence for a few typical line profiles. The results may be used for making counting loss correction more accurately or for suppressing it to a negligible extent.Keywords
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- Absolute Measurement of X-Ray Scattering Factors of CopperJournal of the Physics Society Japan, 1966
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- Absolute Measurement of the Atomic Scattering Factors of Iron, Copper, and AluminumPhysical Review B, 1961