A Method for Measurement of Losses in the Noise-Matching Microwave Network While Measuring Transistor Noise Parameters

Publisher Website

1 January 1987

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques

Vol. 35 (1) , 71-75
https://doi.org/10.1109/tmtt.1987.1133599

Abstract

No abstract available

Keywords

This publication has 13 references indexed in Scilit:

Simplified Noise Evaluation of Microwave Receivers
IEEE Transactions on Instrumentation and Measurement, 1984
Characterization of GaAs FET's in Terms of Noise, Gain, and Scattering Parameters through a Noise Parameter Test Set
IEEE Transactions on Microwave Theory and Techniques, 1984
Determination of Microwave Transistor Noise and Gain Parameters through Noise-Figure Measurements Only
IEEE Transactions on Microwave Theory and Techniques, 1982
Comments on "Simultaneous determination of device noise and gain parameters through noise measurements only"
Proceedings of the IEEE, 1982
Measurement of Losses in Noise-Matching Networks
IEEE Transactions on Microwave Theory and Techniques, 1981
Simultaneous determination of device noise and gain parameters through noise measurements only
Proceedings of the IEEE, 1980
Determination of Microwave Two-Port Noise Parameters Through Computer-Aided Frequency-Conversion Techniques
IEEE Transactions on Microwave Theory and Techniques, 1979
On the determination of device noise and gain parameters
Proceedings of the IEEE, 1979
Source Mismatch Effects on Measurements of Linear Two-Port Noise Temperatures
IEEE Transactions on Instrumentation and Measurement, 1975
A New Method of Characterizing Amplifier Noise Performance
IEEE Transactions on Instrumentation and Measurement, 1970