Design for thermal testability (DfTT) and a CMOS realization
- 15 July 1996
- journal article
- Published by Elsevier in Sensors and Actuators A: Physical
- Vol. 55 (1) , 29-33
- https://doi.org/10.1016/s0924-4247(96)01246-0
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Thermal monitoring of microelectronic structuresMicroelectronics Journal, 1994