On the Use of LEIS to Determine Concentration Depth Profiles in Binary Alloys: Application to PtNi(111)
- 1 January 1996
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 24 (1) , 34-37
- https://doi.org/10.1002/(sici)1096-9918(199601)24:1<34::aid-sia80>3.0.co;2-x
Abstract
No abstract availableKeywords
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