Quantitive analysis of Laue diffraction patterns recorded with a 120 ps exposure from an X-ray undulator
- 1 June 1992
- journal article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 25 (3) , 414-423
- https://doi.org/10.1107/s0021889891014826
Abstract
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