Cause of the 5.0 ev absorption band in pure silica glass
- 1 December 1987
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 95-96, 671-678
- https://doi.org/10.1016/s0022-3093(87)80667-1
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Effect of Oxygen Content on Defect Formation in Pure-Silica Core FibersJapanese Journal of Applied Physics, 1987
- Defect structure of glassesJournal of Non-Crystalline Solids, 1985
- Intrinsic defects in fused silicaJournal of Non-Crystalline Solids, 1985
- Theory of defects in vitreous silicon dioxidePhysical Review B, 1983
- Ion-Implantation Effects in Noncrystalline SiO2IEEE Transactions on Nuclear Science, 1973