Evaluation of MQW Wafer for Surface-Emitting Laser by X-Ray Diffraction
- 1 March 1988
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 27 (3R)
- https://doi.org/10.1143/jjap.27.438
Abstract
Wide-angle double-crystal X-ray diffraction was utilized to characterize a multi-quantum well (MQW) structure designed for a surface-emitting MQW laser. A precise measurement of the period was achieved and an evaluation of the abruptness of a hetero-interface is presented.Keywords
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