Potential distribution in a rectangular semiconductor bar for use with four-point probe measurements
- 31 July 1964
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 7 (7) , 525-529
- https://doi.org/10.1016/0038-1101(64)90089-9
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- On the influence of shape and variations in conductivity of the sample on four-point measurementsApplied Scientific Research, Section B, 1960