A Two-Level Diagnostic Model for Digital Systems

1 January 1979

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers

Vol. C-28 (1) , 16-27
https://doi.org/10.1109/tc.1979.1675218

Abstract

This paper is concerned with the diagnosis of faulty parts in digital systems, including both the detection and location of such parts. The system model presented in this paper considers two levels: the part level at which detectability and diagnosability are defined, and the fault level at which testing is performed and at which functional units or portions thereof are defined. Parameters are defined and used in determining conditions for t-part detectability, t-part diagnosability without repair, and t-part diagnosability with repair. Several examples are presented with the development of the model and derivation of results. These examples illustrate the advantages and limitations of this model.

Keywords

This publication has 8 references indexed in Scilit:

Analysis of Digital Systems Using a New Measure of System Diagnosis
IEEE Transactions on Computers, 1979
A Theory of Diagnosability of Digital Systems
IEEE Transactions on Computers, 1976
System Fault Diagnosis: Masking, Exposure, and Diagnosability Without Repair
IEEE Transactions on Computers, 1975
System Fault Diagnosis: Closure and Diagnosability with Repair
IEEE Transactions on Computers, 1975
An Approach to the Diagnosability Analysis of a System
IEEE Transactions on Computers, 1975
Characterization of Connection Assignment of Diagnosable Systems
IEEE Transactions on Computers, 1974
An Analysis Model for Digital System Diagnosis
IEEE Transactions on Computers, 1970
On the Connection Assignment Problem of Diagnosable Systems
IEEE Transactions on Electronic Computers, 1967