The characteristics of alpha particle effects on 64K CCD's
- 1 January 1979
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 625-628
- https://doi.org/10.1109/iedm.1979.189702
Abstract
The sensitivity of commercially available 64K CCD devices to α particles has undergone a systematic study. The circuit and methods employed for the study are described. The variations of sensitivity with α flux, α energy, circuit frequency, circuit voltage, and data pattern is presented. Data is also discussed relating to the variation from device to device.Keywords
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