Automatic characterization of layers stacks from reflectivity measurements. Application to the study of the validity conditions of grazing X-rays reflectometry

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Abstract
The authors describe in this paper an algorithm to determine automatically the parameters of a stack from experimental reflectivity measurement. Their worked out code allows them to study the influence of different experimental conditions, such as experimental Poisson's noise or a systematical experimental error, on the validity of the results. Their method is used to study stacks by grazing soft X-rays reflectometry.