A Michelson-Type Interferometer for Microwave Measurements

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Abstract
The optical Michelson interferometer is modified by replacing one of its branches by a directional coupler and a waveguide. The instrument serves many purposes, among which are: precision wavelength determination, the measurement of dielectric constants of materials available in sheet form, the determination of reflection from laminated sheets at normal incidence, the study of metal-loaded dielectrics and of parallel-plate metal lens media. An instrument operating at 3.2 cm is described.