Comment on ‘‘Reduction of hot electron degradation in metal oxide semiconductor transistors by deuterium processing’’ [Appl. Phys. Lett. 68, 2526 (1996)]
- 14 October 1996
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 69 (16) , 2441
- https://doi.org/10.1063/1.117664
Abstract
No abstract availableThis publication has 0 references indexed in Scilit: