Dynamics and memory effects in rupture of thermal fuse networks
- 3 February 1992
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 68 (5) , 612-615
- https://doi.org/10.1103/physrevlett.68.612
Abstract
A simple dynamical generalization of the electrical random fuse model for rupture in random media is introduced in which fuses are heated locally by a generalized Joule effect. When their temperature reaches a given threshold, the fuses burn out irreversibly and become insulators. In one limit, the rupture dynamics is spontaneously attracted to the critical state of the bond percolation model. In another limit, it recovers the ‘‘static’’ random fuse model previously studied in the literature. In between these two extremes, the existence of a novel dynamical memory effect produces a rich phenomenology of fractal rupture patterns, which are sensitively dependent upon the input current.Keywords
This publication has 5 references indexed in Scilit:
- Roughness of crack interfacesPhysical Review Letters, 1991
- Scaling and multiscaling laws in random fuse networksPhysical Review B, 1989
- Ground state instability of a random systemPhysical Review Letters, 1987
- Self-organized criticality: An explanation of the 1/fnoisePhysical Review Letters, 1987
- Noise-Driven Sidebranching in the Boundary-Layer Model of Dendritic SolidificationPhysical Review Letters, 1986