Comments on ``Grain boundary contrast in field-ion microscope images''. II
- 1 February 1973
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 44 (2) , 902-906
- https://doi.org/10.1063/1.1662285
Abstract
A recent paper by French and Bishop has discussed the field‐ion contrast from a particular grain boundary configuration as a function of increasing angular misorientation, the images being constructed by computer simulation. Although their boundary configuration was pure tilt about [110], the resulting surface contrast displays apparent tilt and twist character because of the oblique surface section of the emitter tip chosen to contain the boundary trace. The present paper aims to distinguish the contrast events occurring in such images as a function of this apparent tilt and twist character and to quantify the expected contrast in terms of the ``ring‐matching'' contrast theory proposed by the present authors.This publication has 7 references indexed in Scilit:
- The observation of coherent twin lamellae by field-ion microscopyPhilosophical Magazine, 1971
- Grain-Boundary Contrast in Field Ion Microscope ImagesJournal of Applied Physics, 1971
- The direct observation of single slip steps on iridiumSurface Science, 1970
- Observation of Grain Boundaries with the Field-Ion MicroscopeJournal of Applied Physics, 1970
- Dissociated perfect dislocations in the field-ion imagePhilosophical Magazine, 1969
- Contrast from stacking faults and partial dislocations in the field-ion microscopePhilosophical Magazine, 1968
- The interpretation of field-ion micrographs: Contrast from perfect dislocation loopsPhilosophical Magazine, 1968