Self-consistent numerical solutions of p-type inversion layers in silicon mos devices
- 31 December 1976
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 18 (8) , 1021-1023
- https://doi.org/10.1016/0038-1098(76)91230-8
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Variation with Fermi level of the hole cyclotron masses in silicon and germaniumSolid State Communications, 1975
- Localized states ofp-type inversion layers in semiconductor field-effect transistorsPhysical Review B, 1975
- Quantum oscillations in p-type inversion layers of (111) and (100) silicon field effect transistorsSolid State Communications, 1974
- Oscillatory Magnetoconductance of-Type Inversion Layers in Si SurfacesPhysical Review Letters, 1974
- Shubnikov-de Haas oscillations in p-type inversion layers on n-type siliconSolid State Communications, 1974
- Self-Consistent Results for-Type Si Inversion LayersPhysical Review B, 1972
- Motion of Electrons and Holes in Perturbed Periodic FieldsPhysical Review B, 1955