SPECS simulation validation with efficient transient sensitivity computation

Abstract
Transient sensitivity computation in SPECS (simulation program for electronic circuits and systems), which provides a unique capability both to enhance efficiency and to validate simulation results, is described. By using transient sensitivities with respect to the entries of piecewise constant (table) element models and suppressed parasitics, an initially crude and correspondingly quick simulation can be undertaken and then augmented if necessary for improved accuracy. More specifically, table models are refined and parasitics reintroduced only where required in the final analysis as indicated by sensitivity results. This overall approach increases confidence in the results of the SPECS simulation strategy which relies heavily on simplified models for its enhanced efficiency.> Author(s) Nguyen, T.V. Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA Feldmann, P. ; Director, S.W. ; Rohrer, R.A.

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