THE ATOM-PROBE FIELD ION MICROSCOPE
- 1 January 1975
- book chapter
- Published by Elsevier
Abstract
No abstract availableThis publication has 70 references indexed in Scilit:
- Premature field evaporation in the atom probeReview of Scientific Instruments, 1974
- Effect of annealing on the surface composition of stainless steel 410Journal of Vacuum Science and Technology, 1974
- Field Calibration Using the Energy Distribution of Field IonizationPhysical Review Letters, 1973
- The imaging process in field ion microscopyJournal of the Less Common Metals, 1972
- New Directional and Energy Focusing Time of Flight Mass Spectrometers for Special Tasks in Vacuum and Surface PhysicsJournal of Vacuum Science and Technology, 1972
- FIM-atom probe analysis of thin nitride platelets in Fe-3 at.% MoScripta Metallurgica, 1971
- Calibration of the Atom Probe FIMReview of Scientific Instruments, 1969
- Defect Mechanisms in a Noncrystalline SolidJournal of Applied Physics, 1961
- Das FeldionenmikroskopThe European Physical Journal A, 1951
- Elektronenmikroskopische Beobachtungen von FeldkathodenThe European Physical Journal A, 1937