Characterization of films of organofunctional silanes by TOFSIMS and XPS
- 1 January 1991
- journal article
- Published by Taylor & Francis in Journal of Adhesion Science and Technology
- Vol. 5 (10) , 843-863
- https://doi.org/10.1163/156856191x00251
Abstract
The structures of thin films formed by the silanes N-[2-(vinylbenzylamino)-ethyl]-3-aminopropyltrimethoxysilane (SAAPS) and γ-aminopropyltriethoxysilane (γ-APS) deposited onto mechanically polished...Keywords
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