X-ray Pendellösung in garnet epitaxial layers
- 31 December 1974
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 27, 282-286
- https://doi.org/10.1016/s0022-0248(74)80075-8
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Dislocations, facet regions and growth striations in garnet substrates and layersJournal of Crystal Growth, 1974
- Defects in Garnet Substrates and Epitaxial Magnetic Garnet Films Revealed by Phosphoric Acid EtchingJournal of the Electrochemical Society, 1973
- Equal-Thickness Interference Fringes in the Bragg-case Diffraction of X-raysJournal of the Physics Society Japan, 1971
- X-Ray Double Crystal Diffractometer Investigations of Implanted Silicon: D+And N+Advances in X-ray Analysis, 1971
- X-ray Pendellösung fringes in Darwin reflectionActa Crystallographica Section A, 1968
- Messungen zur Röntgenstrahl-Optik des Idealkristalls. II. Diffraction Pattern mit `Pendellösung' gleicher NeigungActa Crystallographica Section A, 1968
- The influence of X-ray polarization on the visibility of pendellösung fringes in X-ray diffraction topographsActa Crystallographica, 1965
- A study of pendellösung fringes in X-ray diffractionActa Crystallographica, 1959