An accurate small-range IC temperature transducer

1 December 1980

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits

Vol. 15 (6) , 1089-1091
https://doi.org/10.1109/jssc.1980.1051522

Abstract

A new IC temperature transducer is described. Main features are: easy calibration, high-output voltage (100 mV//spl deg/C), low-output impedance (70 /spl Omega/), high accuracy (/spl plusmn/0.1/spl deg/C; 20-50/spl deg/C) and low-power dissipation (250 /spl mu/W). The new device, which uses the intrinsic bandgap voltage of silicon as a reference, is especially suited to clinical use.

Keywords

TEMPERATURE
TRANSDUCERS
CIRCUIT TESTING
HYSTERESIS
DETECTORS
VOLTAGE
ANALOG INTEGRATED CIRCUITS
INTEGRATED CIRCUIT LAYOUT
MONOLITHIC INTEGRATED CIRCUITS
POWER SUPPLIES

This publication has 1 reference indexed in Scilit:

Measurement of the temperature dependence of the I/SUB C/(V/SUB be/) characteristics of integrated bipolar transistors
IEEE Journal of Solid-State Circuits, 1980